Title: Advanced Temporal and Phase-Space Diagnostics for X-ray Free-Electron Lasers

Host: Nathan Sitaraman 

Abstract: Precise characterization of electron and photon beams is vital for advancing the performance and scientific capabilities of X-ray free-electron lasers (XFELs). In this seminar, we present recent breakthroughs in time-resolved diagnostics and phase-space reconstruction techniques for XFEL applications. First, we discuss attosecond-resolution measurements enabled by a variable polarization X-band radiofrequency transverse deflecting structure (TDS) at SwissFEL’s Athos beamline, which allow full reconstruction of FEL power profiles with pulse durations as short as 300 attoseconds. Second, we introduce a novel approach for five-dimensional (5D) phase-space tomography, experimentally demonstrated at FLASHForward and later applied at SwissFEL, offering comprehensive insight into the spatial and momentum distributions of GeV-class electron beams. Finally, we explore a self-synchronized, cost-effective diagnostic method using wakefield streaking in corrugated structures, achieving femtosecond temporal resolution without active synchronization. Together, these techniques represent a significant leap forward in ultrafast beam diagnostics, enabling new levels of control and optimization for current and future XFEL facilities.